Variation on atomic force microscopy allows exam of cell membranes

06/3/2013 | Chemical & Engineering News

A new way of using atomic force microscopy could allow researchers to better explore the structure and electrical properties of biological materials such as cell membranes and proteins. The key to the new method, developed by Seong H. Kim at Pennsylvania State University, is changing back and forth between positive and negative voltages at the AFM tip.

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