NIST questions reliability of carbon nanotubes

08/17/2011 | Electronics Weekly (U.K.)

Researchers at the National Institute of Standards and Technology are questioning the reliability of carbon nanotubes for electronic interconnects after testing nanotube interconnects between metal electrodes. "Carbon nanotubes theoretically can carry 1,000 times more electric current than a metal conductor of the same size, but recent tests at NIST suggest device reliability is a major issue," the U.S. government agency stated.

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