Analysis: Foundries are finding yield problems with 28nm processes

11/3/2011 | EE Times

Silicon foundries are running into yield challenges in bringing up 28-nanometer processes, particularly with high-K metal gate complementary metal-oxide semiconductor processes, says Bob Johnson, research vice president for Gartner. Richard Wallace, president and CEO of KLA-Tencor, echoed that sentiment, saying, "Foundry players struggling with their yield issues at 28 (nanometers)."

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