NIST develops a reliability test method for semiconductors

12/15/2011 |

A way to make the reliability qualification of chips easier has been developed by researchers in the Physical Measurement Laboratory at the National Institute of Standards and Technology. The methodology takes transistor-level reliability data and offers predictions on how long a semiconductor circuit could reliably function, depending on the type of application, according to NIST.

View Full Article in:

Published in Briefs:

SmartBrief Job Listings for Business

Job Title Company Location
VP of Video Content Distribution
Calkins Media
Levittown, PA